Lv67
3070 积分 2022-02-22 加入
Nanobeam electron diffraction strain mapping in monocrystalline silicon of modern trench power MOSFETs
20小时前
已完结
X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors
20小时前
待确认
Reverse recovery behavior of 100V-class trench field plate power MOSFETs by pitch shrinkage for DC- DC converters
21小时前
已完结
Improvement of the RON- BV Tradeoff in Field-Plate MOSFETs by Localized Fixed Charges in the Trench Oxide
21小时前
已完结
Novel Multistack Floating Field Plate MOSFET and Image Clustering-Based Design Analysis
21小时前
已完结
Analysis of Body Diode in Trench Field Plate MOSFETs and Reverse Recovery Charge Reduction by Shrinking the Cell Pitch
21小时前
已完结
Investigation of Shape Transformation of Silicon Trenches during Hydrogen Annealing
22小时前
已完结
Reliability Analysis on the Gate Oxide, Body Diode and Package of SiC MOSFET: A Survey
1天前
已完结
TOF-SIMS Analytical Method for Gate Oxide Breakdown Voltage Shift Failure
1天前
已完结
A Review on Gate Oxide Failure Mechanisms of Silicon Carbide Semiconductor Devices
1天前
已完结
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