Lv6
2980 积分 2022-02-22 加入
Influence of EMC Tg on Leakage Current in HTRB Test and Delamination in MSL Test for Power Package
4小时前
待确认
An Investigation of the Drain-Source Leakage Current Early Transients During HTRB Reliability Tests
4小时前
待确认
Identification of Recovering Package Leakage Failure Mode Via Novel Comprehensive Failure Analysis Technique
1个月前
已完结
Identification Of Recovering Idss Failure Mode Via Novel Comprehensive Failure Analysis Technique For Mosfet Device
1个月前
已完结
Dynamic CGD and dV/dt in Superjunction MOSFETs
1个月前
已完结
Gate Ringing in Superjunction MOSFETs with a Parasitic Capacitance in the Load Inductor
1个月前
已完结
A Detailed Analytical Switching Transient Model for Silicon Superjunction MOSFET and SiC Schottky Diode Pair
1个月前
已完结
Strain Engineering in Si Split-Gate Trench Power MOSFETs by Partial Oxidation of Polysilicon Electrodes
1个月前
已完结
Investigation of the Short-circuit Failure Mechanisms in 1.2-kV SiC Trench MOSFETs with Thin N+ Substrates Using Electro-thermal-mechanical Analysis
1个月前
已完结
Increasing the breakdown capability of superjunction power MOSFETs at the edge of the active region
1个月前
已完结
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