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30 积分 2026-09-07 加入
Across-wafer sub-1 nm critical dimension uniformity control by etch tool correction
10分钟前
求助中
H3: Hybrid Architecture Using High Bandwidth Memory and High Bandwidth Flash for Cost-Efficient LLM Inference
30天前
已完结
A Novel 3D Stacked Vertical-Channel High-Voltage Peripheral Transistor for Largely Scaled the WL Driver Circuit of 1000-layer 3D NAND Flash
1个月前
已完结
Scalable High-Voltage Pass Transistor Strustures: Physical-based and Variation-Aware Evaluation Toward 1000 Layer 3D NAND Flash
1个月前
已完结
Die warpage and overlay control using die stress management (DSM)
2个月前
已完结
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