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38 积分 2025-11-13 加入
Single event transient characterization of SiGe HBT by SPA experiment and 3-D process simulation
2天前
已完结
Enhancing radiation hardness of microelectronics through stress-relief milling
9天前
已完结
Quantitative Prediction of Ion-Induced Single-Event Transients in an Operational Amplifier Using a Quasi-Bessel Beam Pulsed-Laser Approach
26天前
已完结
New Approach for Pulsed-Laser Testing That Mimics Heavy-Ion Charge Deposition Profiles
1个月前
已完结
Implications of Elevated Temperatures on the Accuracy of Pulsed-Laser SEE Testing
3个月前
已完结
Study of Laser-Induced Single Event Effects in SiC Power MOSFETs
4个月前
已完结
Implications of Elevated Temperatures on the Accuracy of Pulsed-Laser SEE Testing
4个月前
已完结
Single Event Transient Evaluation of 7nm FinFET LUT4 Representative of Versal
4个月前
已完结
A Correlation Study of SRAM SEU Cross Sections Between 1064-nm Laser and Heavy-Ion Testing
4个月前
已完结
Study of Laser-Induced Single Event Effects in SiC Power MOSFETs
7个月前
已完结
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