Lv3
370 积分 2023-05-25 加入
Silicides for integrated circuits: TiSi2 CoSi2
1个月前
已完结
Reliability failure induced by the Si epitaxy growth on PMOS high voltage oxide in 0.15/spl mu/m embedded flash memory devices
1个月前
已完结
Control gate-bit line leakage induced cobalt silicide migration in 0.15/spl mu/m embedded flash memory devices
1个月前
已完结
Self-aligned Ti and Co silicides for high performance sub-0.18 μm CMOS technologies
1个月前
已完结
Formation of epitaxial CoSi2 spike in Co/Si3N4/Si(100) system and its crystallographic structure
1个月前
已完结
Investigation of hot-carrier-injection assisted TDDB and multi-stage hot-hole induced leakage current in BCD HV NMOS
3个月前
已完结
A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET
3个月前
已完结
Physics-Based Hot-Carrier Degradation Modeling
3个月前
已完结
Physics-Based Hot-Carrier Degradation Modeling
3个月前
已关闭
Self-Limiting Behavior of Hot Carrier Degradation and Its Implication on the Validity of Lifetime Extraction by Accelerated Stress
3个月前
已完结
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