| 标题 |
Cobalt Silicide Formation Characteristics in a Single Wafer Rapid Thermal Furnace (SRTF) System |
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期刊:2006 14th IEEE International Conference on Advanced Thermal Processing of Semiconductors 作者:Igor J. Malik; Michel Ouaknine; Takeshi Ueda; Takashi Fukada; Woo Sik Yoo; et al 出版日期:2007-06-21 |
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(2025-6-4)