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248 积分 2025-10-31 加入
Characterization of Deep and Shallow Traps in GaN HEMT Using Multi-Frequency C-V Measurement and Pulse-Mode Voltage Stress
7小时前
已完结
Using Gate Leakage Conduction to Understand Positive Gate Bias Induced Threshold Voltage Shift in p-GaN Gate HEMTs
7小时前
已完结
Impact of electrical degradation on trapping characteristics of GaN high electron mobility transistors
5天前
已完结
Multi-bias capacitance voltage characteristic of AlGaN/GaN HEMT
5天前
已完结
Identification of Trap States in p-GaN Layer of a p-GaN/AlGaN/GaN Power HEMT Structure by Deep-Level Transient Spectroscopy
5天前
已完结
Understanding $\gamma$ -Ray Induced Instability in AlGaN/GaN HEMTs Using a Physics-Based Compact Model
13天前
已完结
Investigation of trapping effects in Schottky lightly doped P-GaN gate stack under γ-ray irradiation
13天前
已完结
Gate leakage mechanisms caused by 60Co gamma irradiation on p-GaN gate AlGaN/GaN HEMTs
13天前
已完结
Ionizing radiation damage mechanism and biases correlation of AlGaN/GaN high electron mobility transistor devices
13天前
已完结
Understanding $\gamma$ -Ray Induced Instability in AlGaN/GaN HEMTs Using a Physics-Based Compact Model
17天前
已完结
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