Lv1
50 积分 2025-10-15 加入
All-dielectric, visible wavelength focusing metalens with planar surface for mechanical robustness
5天前
已关闭
Model based OPC for implant layer patterning considering wafer topography proximity (W3D) effects
8天前
已完结
On-Chip Cascaded Metasurfaces for Visible Wavelength Division Multiplexing and Color-Routing Meta-Display
1个月前
已完结
Study of Etch Stop Layer on Characteristics of Amorphous Aluminum Oxide Thin Film
1个月前
已关闭
Machine Learning for Deep Trench Bottom Width Measurements using Scatterometry : AM: Advanced Metrology
1个月前
已完结
Non-destructive depth measurement using SEM signal intensity
1个月前
已完结
Influence of refractive index, thickness and extinction coefficient on thin film reflectance
1个月前
已完结
Improving OPC modeling accuracy with rigorous and compact modeling deformation effects in photoresists
1个月前
已完结
Machine Learning for Deep Trench Bottom Width Measurements using Scatterometry : AM: Advanced Metrology
1个月前
已完结
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