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18 积分 2026-08-21 加入
Investigation of dual-metal/dielectric with III–V heterojunction extended-source gate-all-around vertical TFET for enhanced electrical performance
8小时前
已完结
Heterojunction gate all around ferroelectric p-n-i-n tunnel FET with reduced Miller capacitance: a comprehensive analysis with analytical modeling and TCAD simulation
9小时前
待确认
Effect of Temperature on the Electrical Characteristics of All Silicon p-n-i-n TFET Device
10小时前
已完结
Improvement in Reliability of Tunneling Field-Effect Transistor With p-n-i-n Structure
11小时前
已完结
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