Lv1
80 积分 2022-07-27 加入
Voltage Ramp Stress for Bias Temperature Instability Testing of Metal-Gate/High- $k$ Stacks
1天前
已关闭
A Study of Pattern Density and Process Variations Impact on the Reliability Performance of Multi-Level Capacitance Structure in Low-k Copper Interconnects
2个月前
已完结
Investigation of the Moisture- Driven Dynamics of Time- Dependent Dielectric Breakdown in Polymeric Dielectrics for Galvanic Isolators
5个月前
已完结
Experimental and Modeling Investigation of the Temperature Activation of TDDB in Galvanic Isolators Based on Polymeric Dielectrics
5个月前
已完结
Modeling the Temperature Dependence of TDDB in Galvanic Isolators Based on Polymeric Dielectrics
5个月前
已完结
Polyimide-based Integrated Transformers and Capacitors for High Voltage Galvanic Isolation
5个月前
已完结
The Study of Activation Energy of Electromigration at Different Temperature
7个月前
已完结
Universal Hot Carrier Degradation Model under DC and AC Stresses
1年前
已完结
New High Performance Transistors by the Blanket Large-Angle-Tilt Implant for N-Channel LDDS and P-Channel Halos
2年前
已完结
皖公网安备34019202002308
