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52 积分 2025-11-23 加入
A comprehensive survey for real-world industrial surface defect detection: Challenges, approaches, and prospects
18天前
已完结
Enhanced detection of unknown defect patterns on wafer bin maps based on an open-set recognition approach
1个月前
已完结
A Novel Method Based on Deep Convolutional Neural Networks for Wafer Semiconductor Surface Defect Inspection
2个月前
已完结
Semiconductor Wafer Particle Defect Classification Based on Deep Learning and Multimodal Feature Fusion
3个月前
已完结
Mixed-type micro-defect detection in semiconductor Wafers: A dual-modal feature real-time detection approach via optical topography and lightweight classification network
3个月前
已完结
Incremental learning strategies for improved detection of unknown defects in wafer maps with limited samples
3个月前
已完结
Incremental learning strategies for improved detection of unknown defects in wafer maps with limited samples
3个月前
已关闭
Semiconductor Wafer Particle Defect Classification Based on Deep Learning and Multimodal Feature Fusion
4个月前
已完结
Incremental learning strategies for improved detection of unknown defects in wafer maps with limited samples
4个月前
已完结
MDCA-DETR: DETR with multi-channel deformable convolution and coordinate attention for mini-LED wafer surface defects detection
4个月前
已完结
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