Lv3
244 积分 2024-01-03 加入
Formation of basal plane dislocations by stress near epilayer/substrate interface of large-diameter SiC wafers with thick epitaxial layers
1个月前
已完结
Structure Defects in CVD-Grown Silicon Carbide Epitaxial Wafers: From Fundamental Principles to Advanced Reduction Strategies
1个月前
已完结
Unlocking different types of basal plane dislocations and its evolution in 4H-SiC
1个月前
已完结
Harnessing Biofilm Scaffold for Structurally Adaptative Slippery Surfaces with Integrated Antifouling and Anti‐Corrosion Properties
1年前
已完结
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