Lv21
110 积分 2025-12-17 加入
Atom probe tomography of nanomaterials
3小时前
求助中
(Invited) Surface Free Energy and Interfacial Strain in HfO2 and Hzo Ferroelectric Formation
12天前
已关闭
Advantages and Challenges of 3-D Atom Probe Tomography Characterization of FinFETs
1个月前
已关闭
Advantages and Challenges of 3-D Atom Probe Tomography Characterization of FinFETs
1个月前
已关闭
(Invited) Surface Free Energy and Interfacial Strain in HfO2 and Hzo Ferroelectric Formation
3个月前
已关闭
A Statistical Approach for Evaluating the Spatial Distribution and Local Atomic Environment of Dopants Using Atom Probe Tomography
5个月前
已完结
Physical and Electrical Properties of MOCVD and ALD Deposited HfZrO4 Gate Dielectrics for 32nm CMOS High Performance Logic SOI Technologies
6个月前
已关闭
Three-Dimensional Elemental Analysis of Commercial 45 nm Node Device with High-$k$/Metal Gate Stack by Atom Probe Tomography
6个月前
已关闭
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