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10 积分 2026-05-10 加入
Atomic Layer Deposition of Al-Doped ZrO2Thin Films as Gate Dielectric for In0.53Ga0.47As
1天前
待确认
(Invited) Electrical Characterization of Defects in Al2O3
1天前
已完结
Band offsets of wide-band-gap oxides and implications for future electronic devices
1个月前
已完结
Ellipsometry and XPS comparative studies of thermal and plasma enhanced atomic layer deposited Al2O3-films
3个月前
已完结
Soft x-ray photoemission studies of Hf oxidation
3个月前
已完结
Energy band alignments of Al2O3–HfO2/Al2O3 nanolaminates–SiO2–p-type Si structures
3个月前
已完结
Energy band alignments of Al2O3–HfO2/Al2O3 nanolaminates–SiO2–p-type Si structures
4个月前
已完结