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40 积分 2023-07-01 加入
The Effect of Fin Structure in 5 nm FinFET Technology
2个月前
已关闭
Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction
3个月前
已关闭
Reliability challenges in CMOS technology: A manufacturing process perspective
3个月前
已完结
Gate Work Function-Engineered Graded-Channel Macaroni MOSFET: Exploration of Temperature and Localized Trapped Charge-Induced Effects with GIDL Analysis
3个月前
已完结
Gate Work Function-Engineered Graded-Channel Macaroni MOSFET: Exploration of Temperature and Localized Trapped Charge-Induced Effects with GIDL Analysis
3个月前
已完结
Process integration for on-chip interconnects
4个月前
已完结
Characterization techniques of ion bombardment damage on electronic devices during plasma processing—plasma process-induced damage
5个月前
已完结
AC TDDB Analysis for HK/IL Gate Stack Breakdown and Frequency-dependent Oxygen Vacancy Trap Generation in Advanced nodes FinFET Devices by SILC Spectrum Methodology
7个月前
已完结
An improved method for measuring epi-wafer thickness based on the infrared interference principle: Addressing interference quality and multiple interferences in double-layer structures
8个月前
已完结
Reliability challenges in CMOS technology: A manufacturing process perspective
9个月前
已完结
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