Lv1
30 积分 2023-07-01 加入
Understanding electromigration failure behaviors of narrow cobalt lines and the mechanism of reliability enhancement for extremely dilute alloying of manganese oxide
12小时前
求助中
Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction
2天前
已完结
Aging measurement and empirical modeling of BTI on FPGA using 16 nm FinFETs for static and dynamic stresses
2天前
求助中
Addressing interconnect challenges for enhanced computing performance
21天前
已完结
Investigating the degradation and products of thermo-oxidation of polyimide-based engineering plastics
26天前
已完结
Reliability Study of Critical Structural Redistribution Layers in Advanced Packaging: A Review
2个月前
已完结
Review of Semiconductor Flash Memory Devices for Material and Process Issues
3个月前
已完结
Review of Semiconductor Flash Memory Devices for Material and Process Issues
4个月前
已完结
Functionalizing self-assembled monolayers to reduce interface scattering in ruthenium/dielectric for next-generation microelectronic interconnects
4个月前
已完结
Review of Semiconductor Flash Memory Devices for Material and Process Issues
4个月前
已完结
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