Lv12
20 积分 2025-05-07 加入
Lattice strain mapping using circular Hough transform for electron diffraction disk detection
3小时前
待确认
Strain characterization of fin-shaped field effect transistors with SiGe stressors using nanobeam electron diffraction
3小时前
已完结
In Situ Localization Techniques of Defects in Advanced Semiconductor Devices from Macro-Scale to Atomistic-Scale
2个月前
已完结
Innovations in GaN HEMT Design: Achieving Superior Power Output and Thermal Management
2个月前
已完结
An Area-Efficient 16-Bit Four-Channel R-2R DAC Based on Switching On-Resistance Adaptive Calibration Technique
2个月前
已完结
A Superior SiC Lateral MOSFET with Patterned P-Bury Layer Made on N-Type Wafers
2个月前
已关闭
Performance Study of Sub-5 nm FinFET and GAA Structures at Low Temperature
4个月前
已完结
Investigation of GIDL RTN Mechanism in FinFET: Experimental Evidence and Theoretical Analysis
6个月前
已完结
Investigation of GIDL RTN Mechanism in FinFET: Experimental Evidence and Theoretical Analysis
6个月前
已关闭
Complex Nanotwin Substructure of an AsymmetricΣ9Tilt Grain Boundary in a Silicon Polycrystal
8个月前
已完结
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