Lv55
960 积分 2025-11-02 加入
Detailed and analytical approach in the discovery of cracks on thin passivation layer underneath the polyimide structure of a die
3天前
已完结
NexFET纯化层Polyimide工艺建立及优化
3天前
已完结
HTRB failure mechanism of 1200 V SiC MOSFET induced by abnormal electric field distribution in FLR termination
9天前
已完结
SACVD BPSG Tungsten Extrusion Elimination
16天前
已完结
A failure mechanism and improved method for abnormal IDS leakage current of shield gate trench MOSFET
18天前
已完结
Power Semiconductor Die Passivation Layer Stress Mechanism Investigation and optimization by Numerical Analysis
1个月前
已完结
Avalanche Capability Improvement by Optimizing p+ Contact Resistance for N-Channel Trench Power MOSFETs
1个月前
已完结
Investigation of Degradation Mechanisms in SiC MOSFETs Under Synergy Negative Gate Voltage Stress and High-Temperature Reverse Bias
2个月前
已完结
Analysis of Factor Impacts on On-resistance for Power MOSFET Layout Design with Fully Automatic Flow
2个月前
已完结
Chip Layout Optimization of Trench Length and the Upper Electrode Contact in Trench Field Plate MOSFET
5个月前
已完结
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