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1150 积分 2025-11-02 加入
A New Failure Mechanism and Improved Method for Abnormal I Ds Leakage Current of Shield Gate Trench Mosfet
6天前
已关闭
A failure mechanism and improved method for abnormal IDS leakage current of shield gate trench MOSFET
6天前
已完结
Failure Analysis and Research on Shielded-Gate Trench MOSFET
6天前
已完结
Thermal instability failure analysis of Shielded-gate Trench MOSFET in linear mode
6天前
已完结
BPSG介质层的缺陷失效机制研究
11天前
已完结
Power MOSFETs With Super Safe-Operating-Area
1个月前
已完结
Detailed and analytical approach in the discovery of cracks on thin passivation layer underneath the polyimide structure of a die
1个月前
已完结
NexFET纯化层Polyimide工艺建立及优化
1个月前
已完结
HTRB failure mechanism of 1200 V SiC MOSFET induced by abnormal electric field distribution in FLR termination
1个月前
已完结
SACVD BPSG Tungsten Extrusion Elimination
2个月前
已完结
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