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52 积分 2022-11-02 加入
A Comparative Study of Different Physics-Based NBTI Models
3天前
已完结
A study using two stage NBTI model for 32 nm high-k PMOSFET
3天前
已完结
Impacts of HF etching on ultra-thin core gate oxide integrity in dual gate oxide CMOS technology
1个月前
已完结
Effect of Nitrogen Profile and Fluorine Incorporation on Negative-Bias Temperature Instability of Ultrathin Plasma-Nitrided SiON MOSFETs
1个月前
已完结
Self-heating and its implications on hot carrier reliability evaluations
2个月前
已完结
Temperature sense effect in HCI self-heating de convolution: Application to 28nm FDSOI
2个月前
已完结
Investigation of Saturated Drain Current Change Phases For PMOS HCI Stressed at Ibmax
2个月前
已完结
Analysis for the Physical Mechanism of the Abnormal Increase of Idsat in NMOS under HCI
2个月前
已完结
H-related defect complexes in HfO2: A model for positive fixed charge defects
4个月前
已完结
Defect correlated with positive charge trapping in functional HfO2 layers on (100)Si revealed by electron spin resonance: Evidence for oxygen vacancy?
4个月前
已完结
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