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48 积分 2022-11-02 加入
H-related defect complexes in HfO2: A model for positive fixed charge defects
1个月前
已完结
Defect correlated with positive charge trapping in functional HfO2 layers on (100)Si revealed by electron spin resonance: Evidence for oxygen vacancy?
1个月前
已完结
Electrooptical effects in silicon
3个月前
已完结
Grating Couplers for Coupling between Optical Fibers and Nanophotonic Waveguides
4个月前
已完结
Edge Couplers in Silicon Photonic Integrated Circuits: A Review
4个月前
已完结
Ultra Shallow Junction and Super Steep Halo Formation Using Carbon Co-implantation for 65nm High Performance CMOS Devices
7个月前
已完结
On the Physical Mechanism of NBTI in Silicon Oxynitride p-MOSFETs: Can Differences in Insulator Processing Conditions Resolve the Interface Trap Generation versus Hole Trapping Controversy?
9个月前
已完结
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