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313 积分 2021-05-23 加入
SILC and TDDB reliability of novel low thermal budget RMG gate stacks
4小时前
待确认
Electrical Characterization of highly stable 10nm triple-gate FinFET for different contacts and oxide region materials
2个月前
已完结
Investigation of TiN/LaO x Interface Dipole Effect on Negative Flat-Band Voltage ( V FB ) Shift in TiN/LaO x /HfO 2 /SiO 2 Gate Stacks Using Dipole-Last Technology
2个月前
已完结
Record 7(N)+7(P) Multiple VTs Demonstration on GAA Si Nanosheet n/pFETs using WFM-Less Direct Interfacial La/Al-Dipole Technique
3个月前
已完结
Enabling Multiple-Vt Device Scaling for CMOS Technology beyond 7nm Node
3个月前
已完结
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