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40 积分 2025-01-14 加入
A comparative study of principal component analysis and machine learning for semiconductor micro-defect detection using scanning acoustic microscopy
1个月前
已完结
Epitaxial Growth of Large‐Scale 2D CrTe2 Films on Amorphous Silicon Wafers With Low Thermal Budget
2个月前
已完结
DTCO for Fast STT-MRAM Periphery Operation
2个月前
已完结
STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes
2个月前
已完结
World First 8nm 128Mb Embedded STT-MRAM for Automotive Application
2个月前
已完结
Realizing high-performance, enhanced write endurance of low-RA STT-MRAM through MgO tunnel barrier engineering
2个月前
已完结
Fabrication and Individual Addressing of STT-MRAM Bit Array With 50 nm Full Pitch
3个月前
已完结
Development and Comprehensive Evaluation of TMR Sensor-Based Magnetrodes
5个月前
已完结
Virtual defect metrology system utilizing photolithography scanner topography maps to quantitatively detect gross defects, perform inline yield prediction, and identify defect-generating tools
5个月前
已完结
Improved Yield Prediction and Failure Analysis in Semiconductor Manufacturing with XGBoost and Shapley Additive exPlanations Models
6个月前
已完结
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