| 标题 |
Simultaneous Determination of Carrier Concentration, Mobility, and Thickness of SiC Homoepilayers by Infrared Reflectance Spectroscopy |
| 网址 | |
| DOI | |
| 其它 |
期刊:Japanese Journal of Applied Physics 作者:Shingo Oishi; Yasuto Hijikata; Hiroyuki Yaguchi; Sadafumi Yoshida 出版日期:2006-11-17 |
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(2025-6-4)