| 标题 |
Peridynamic modeling of void nucleation and growth in metal lines due to electromigration in a finite element framework |
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| DOI | |
| 其它 |
期刊:Computer Methods in Applied Mechanics and Engineering 作者:Yanan Zhang; Sundaram Vinod K. Anicode; Xuejun Fan; Erdogan Madenci 出版日期:2023-09-01 |
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(2025-6-4)