| 标题 |
Optimizing extreme ultraviolet lithography imaging metrics as a function of absorber thickness and illumination source: a simulation case study of Ta-Co alloy |
| 网址 | |
| DOI |
10.1117/1.jmm.22.3.033201
doi
|
| 其它 |
期刊:Journal of Micro/Nanopatterning, Materials, and Metrology 作者:Devesh Thakare; Annelies Delabie; Vicky Philipsen 出版日期:2023-08-07 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)