| 标题 |
[高分]
Adhesive Strength and Diffusion at Interfaces between Sintered Cu Layer and Metal Surfaces (Cu, Ag, Au, Pd, Pt, Ni, NiPx, and NiBx) |
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| DOI | |
| 其它 |
期刊:2023 International Conference on Electronics Packaging (ICEP) 作者:Dai Ishikawa; Hideo Nakako; Thomas Blank; Helge Wurst; Felix Steiner 出版日期:2023-05-23 |
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(2025-6-4)