| 标题 |
Experimental study of the series resistance effect and its impact on the compact modeling of the conduction characteristics of HfO2-based resistive switching memories |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:D. Maldonado; F. Aguirre; G. González-Cordero; A. Roldán; M. B. González; et al 出版日期:2021-08-06 |
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(2025-6-4)