| 标题 |
Cross-modal dual-prompt region alignment for wafer defect recognition based on vision-language pre-training in semiconductor manufacturing |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced Engineering Informatics 作者:Shulong Gu; Zihao Lei; Guangrui Wen; Rui Feng; Jing Huang; et al 出版日期:2027-01-01 |
| 求助人 | |
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(2025-6-4)