| 标题 |
A simulation of fin structures thermal design for high-power integrated circuit dynamic burn-in test |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Pengfei Hu; Yuansheng Li; Zhangzhao Weng; Jun Luo; Zhizhe Wang; et al 出版日期:2026-11-01 |
| 求助人 | |
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(2025-6-4)