| 标题 |
Sensor location, identification, and multivariable iterative learning control of an RTP process for maximum uniformity of wafer temperature distribution |
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| DOI | |
| 其它 |
期刊:11th IEEE International Conference on Advanced Thermal Processing of Semiconductors. RTP 2003 作者:M. Cho; Y. Lee; S. Joo; K.S. Lee 出版日期:2004-03-22 |
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(2025-6-4)