| 标题 |
Raman Characterization of the Charge Density Wave Phase of 1T-TiSe2: From Bulk to Atomically Thin Layers |
| 网址 | |
| DOI | |
| 其它 |
期刊:ACS Nano 作者:Dinh Loc Duong; Gihun Ryu; Alexander Hoyer; Chengtian Lin; Marko Burghard; et al 出版日期:2017-01-10 |
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(2025-6-4)