| 标题 |
Small dense Mini/Micro LED high-precision inspection based on instance segmentation with local detail enhancement |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced Engineering Informatics 作者:Jie Chu; Jueping Cai; Long Li; Biao Hou; Kailin Wen; et al 出版日期:2025-02-12 |
| 求助人 | |
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(2025-6-4)