| 标题 |
Study of microdefects and their distribution in dislocation-free Si-doped HB GaAs by X-ray diffuse scattering on triple-crystal diffractometer |
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| DOI | |
| 其它 |
期刊:Journal of Crystal Growth 作者:L.A. Charniy; A.N. Morozov; V.T. Bublik; K.D. Scherbachev; I.V. Stepantsova; V.M. Kaganer 出版日期:1992 |
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(2025-6-4)