| 标题 |
Experimental and numerical analysis of the effects of ion bombardment in silicon oxide (SiO2) plasma enhanced atomic layer deposition (PEALD) processes |
| 网址 | |
| DOI | |
| 其它 |
期刊:Japanese Journal of Applied Physics 作者:Hu Li; Tomoko Ito; Kazuhiro Karahashi; Munehito Kagaya; Tsuyoshi Moriya; et al 出版日期:2020 |
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(2025-6-4)