| 标题 |
In-situ TEM analysis of reversible antiferroelectricity in ZrO2 thin films via near-constant-volume tetragonal symmetry transition |
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| DOI | |
| 其它 |
期刊:Materials Today 作者:Hsin-Yu Hsieh; Hung-Wei Yen; Yi-An Chen; Hsiang-Chih Chan; Chin-Lung Kuo; et al 出版日期:2026-02-25 |
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(2025-6-4)