| 标题 |
High-Throughput Discovery of 2D van der Waals Gate Dielectrics by Interpretable Machine Learning for Sub-1-nm Equivalent Oxide Thickness Scaling |
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| 其它 |
期刊:Colloids and Surfaces A: Physicochemical and Engineering Aspects 作者:Zhen Wang; Ming Chen; Zi-Qian Xu; Jin-Shun Bi; Wen-Jun Xiao; et al 出版日期:2026-05-01 |
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(2025-6-4)