| 标题 |
Transmission electron microscope study of the crystal structures and microstructures of ZrSi and HfSi in ultrahigh vacuum deposited metal thin films on (111)Si |
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| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:W. Y. Hseih; L. J. Chen 出版日期:2002-07-26 |
| 求助人 | |
| 下载 |
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(2025-6-4)