| 标题 |
Defect characterization and charge transport measurements in high-resolution Ni/n-4H-SiC Schottky barrier radiation detectors fabricated on 250 μm epitaxial layers 250 μ m外延层高分辨率Ni/n-4H-SiC肖特基势垒辐射探测器的缺陷表征和电荷输运测量
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| 其它 |
期刊:Journal of Applied Physics 作者:Joshua W. Kleppinger; Sandeep K. Chaudhuri; OmerFaruk Karadavut; Krishna C. Mandal 出版日期:2021-06-25 |
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(2025-6-4)