| 标题 |
Study on the single-event burnout mechanism of β-Ga2O3 heterojunction diodes under heavy-ion irradiation |
| 网址 | |
| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Yahui Feng; Hongxia Guo; Jinxin Zhang; Wuying Ma; Xiaoping Ouyang; et al 出版日期:2026 |
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(2025-6-4)