| 标题 |
Characterization of Structural and Dielectric Properties of Silicon Nitride Thin Films Deposited by PECVD |
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| 其它 |
期刊:2024 IEEE 5th International Conference on Dielectrics (ICD) 作者:T. Al Moussi; C. O'Dalaigh; J. Esvan; P. Lambkin; R. Lakshmanan; et al 出版日期:2024 |
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(2025-6-4)