Lv2
190 积分 2025-03-25 加入
Characterization of Structural and Dielectric Properties of Silicon Nitride Thin Films Deposited by PECVD
5个月前
已完结
Optimization of the Sputtering Process for TiN Thin Films as Electrodes in DRAM Capacitors
6个月前
已关闭
Breakdown voltage and TDDB performance improvement by optimizing the PECVD dielectric film characteristics in MIM capacitors
6个月前
已完结
In Situ Pre-Metallization Cleaning of CoSi2 Contact-Hole Patterns with Optimized Etching Process
6个月前
已完结
Influence of Si surface preparation on CoSi2 formation and agglomeration
7个月前
已完结
Effect of Al doping on structural and electrical properties of HfO2/ZrO2 layered structures for high-k applications
7个月前
已完结
Influence of CoSi Oxidation and Passivation During Silicide Selective Etching on Junction Leakage: Applications to Schottky Diodes Devices
10个月前
已完结
Influence of CoSi Oxidation and Passivation During Silicide Selective Etching on Junction Leakage: Applications to Schottky Diodes Devices
11个月前
已完结
Study of the Formation of Copper Void Defect and Process Optimization For Reduction In Dual Damascene Process
1年前
已完结
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