| 标题 |
Defect Detection in Textures through the Use of Entropy as a Means for Automatically Selecting the Wavelet Decomposition Level |
| 网址 | |
| DOI | |
| 其它 |
期刊:Sensors 作者:Pedro Navarro; Carlos Fernández-Isla; Pedro Alcover; Juan Suardíaz 出版日期:2016-07-27 |
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(2025-6-4)