| 标题 |
Chemical reactions induced by low-energy electron exposure on a novel inorganic-organic hybrid dry EUV photoresist deposited by molecular atomic layer deposition (MALD) |
| 网址 | |
| DOI |
10.1117/12.2641647
doi
|
| 其它 |
期刊:International Conference on Extreme Ultraviolet Lithography 2022 作者:Dan N. Le; Su Min Hwang; Jihoon Woo; Seungsoo Choi; Taehee Park; et al 出版日期:2022-11-11 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)