| 标题 |
Corrosion and conductivity damage of AgNW transparent conductive thin films under a simulated sulfur-containing atmosphere and mechanical force |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Shan Wan; Tingting Wen; Bokai Liao; Xingpeng Guo 出版日期:2024-11-01 |
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(2025-6-4)