| 标题 |
Defect Classification With SVM and Wideband Excitation in Multilayer Aluminum Plates |
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期刊:IEEE Transactions on Instrumentation and Measurement 作者:Dario Jeronimo Pasadas; Helena Geirinhas Ramos; Bo Feng; Prashanth Baskaran; Artur Lopes Ribeiro 出版日期:2019-02-05 |
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(2025-6-4)