| 标题 |
Black silicon method: X. A review on high speed and selective plasma etching of silicon with profile control: an in-depth comparison between Bosch and cryostat DRIE processes as a roadmap to next generation equipment |
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| DOI | |
| 其它 |
期刊:Journal of Micromechanics and Microengineering 作者:Henri Jansen; Meint J. de Boer; S. Unnikrishnan; Marcus Louwerse; M. Elwenspoek 出版日期:2009-02-02 |
| 求助人 | |
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(2025-6-4)