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Electric field-driven the electronic properties and contact behavior of the metal/semiconductor NbS2/Sc2CF2 heterostructure |
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期刊:Dalton Transactions 作者:Thi Nhan Tran; Pham T. Truong; Huynh V. Phuc; Nguyen N. Hieu; Viet Bac Thi Phung; Chuong V. Nguyen 出版日期:2025-04-02 |
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(2025-6-4)