| 标题 |
Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Jiajie Fan; Chaohua Yu; Cheng Qian; Xuejun Fan; Guoqi Zhang 出版日期:2017-07-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)