| 标题 |
Electro Optical Terahertz Pulse Reflectometry - a Fast and Highly Accurate Non-Destructive Fault Isolation Technique for 3D Flip Chip Packages |
| 网址 | |
| DOI |
10.31399/asm.cp.istfa2013p0264
doi
|
| 其它 |
期刊: 作者:S. Barbeau 出版日期:2013-11-05 |
| 求助人 | |
| 下载 |
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(2025-6-4)