| 标题 |
Heavy-Ion-Induced Dynamic R ON Degradation in GaN HEMTs: Mechanism and Suppression With AlGaN Back Barrier |
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| 其它 |
期刊:2025 22nd China International Forum on Solid State Lighting & 2025 11th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS) 作者:Minze Wang; Xuan Xie; Ziang Wang; Chenyue Chu; Guangwei Xu; et al 出版日期:2026-01-01 |
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(2025-6-4)