| 标题 |
Reliability Analysis of Copper Paste Joints between Ni/Au-Coated SiC Chips and AMB Substrates during High-Temperature Aging |
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| DOI | |
| 其它 |
期刊:2026 International Conference on Electronics Packaging and Hybrid Bonding Symposium (ICEP-HBS) 作者:Seungmin Cho; Chuantong Chen; Sangmin Lee; Fupeng Huo; Minseo Kim; et al 出版日期:2026-04-14 |
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(2025-6-4)