| 标题 |
Highly Reliable Van Der Waals Memory Boosted by a Single 2D Charge Trap Medium |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced Materials 作者:Chao Liu; Jie Pan; Qihui Yuan; Chao Zhu; Jianquan Liu; et al 出版日期:2023-10-26 |
| 求助人 | |
| 下载 |