| 标题 |
Charge trapping in alumina and its impact on the operation of metal-alumina-nitride-oxide-silicon memories: Experiments and simulations |
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| DOI | |
| 其它 |
期刊:Journal of Applied Physics 作者:Andrea Padovani; Luca Larcher; Vincenzo Della Marca; Paolo Pavan; Hokyung Park; Gennadi Bersuker 出版日期:2011-07-12 |
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(2025-6-4)